Pete Singer / Solid State Technology
Overcoming the Semiconductor EUV Fab Dilemma of Stochastics – While the conventional approach thinks of noise as a nuisance that must be thrown away, the Fractilia Inverse Linescan Model approach thinks of noise as information that should be measured and used. Overcoming the Semiconductor EUV Fab Dilemma of Stochastics was posted by Pete Singer on Semiconductor Digest. CHRIS MACK, …
